Osai extends its portfolio of test handler solutions. The NeoKGD was developed starting from the need to assure customers of the quality of the devices that make up power modules. An Osai solution that allows semiconductor devices to be tested at the wafer level to provide customers with true Known Good Dies (KGD).
In a market where demand for the application of power modules is constantly growing, the NeoKGD meets the testing needs of OSAT (Open source appropriate technology) and IREM (International Rental Electronics Machines) customers. Through three independently configurable test stations, electrical, ambient and temperature functional tests take place, as well as subsequent six-sided optical inspection of components, 6S (six sides Inspection).
The core of the NeoKGD consists of the detachment phase and the test phase, with the appropriate probe cards, high-tech devices to test the operation of the chips during their construction process, which go to contact the PEGs of the component that do not generate inherent defects, delivering, at the end of the production cycle, tested and defect-free integrated circuits.
This dedicated system for testing KGDs is designed to carry out testing at high speed, ensuring excellent results in terms of cycle time and performance – 1800 UPH. NeoKGD will be officially presented during PCIM EUROPE 2024 (Nuremberg, 11-13 June), one of the main exhibitions for the Power Electronics Industry.
We look forward to seeing you at our booth, Hall 6 – Booth 240. Don’t miss the opportunity to book an appointment with our commercial team in advance, by clicking here.
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