KGD Test Handler
Osai extends its portfolio of test handler solutions. The NeoKGD was developed starting from the need to assure customers of the quality of the devices that make up power modules. An Osai solution that allows semiconductor devices to be tested at the wafer level to provide customers with true Known Good Dies (KGD). In a market where demand for the application of power modules is constantly growing, the NeoKGD meets the testing needs of OSAT (Open source appropriate technology) and [...]