Multi‑Station Discrete Test Handler for TPAK Power MOSFETs
The NeoDTH is a high‑performance multi‑station discrete test handler engineered to meet the most demanding requirements of power semiconductor testing. Specifically designed for TPAK Power MOSFETs, it delivers advanced thermal testing capabilities, high throughput up to 2,700 units per hour, and seamless integration into modern automated factories. A robust and flexible platform built for automotive, industrial, and power electronics applications where quality, reliability, and productivity are critical.
True power device validation occurs under real operating conditions.
The NeoDTH is designed to perform accurate, stable, and repeatable thermal tests, ensuring the reliable characterization of Power MOSFETs throughout the production process. The system supports programmable thermal soak up at temperatures of up to 175°C, with an accuracy of ±3°C, and features active temperature control at each test station. An optional nitrogen atmosphere provides additional protection for the device during high-temperature testing. This makes the NeoDTH ideal for high‑temperature electrical testing, stress validation, and corner‑lot verification.
The result is superior correlation with real‑world operating conditions and consistent, reliable product quality.
This test solution has been developed with one clear focus: to maximize performance when testing TPAK Power MOSFETs. Every detail, from device handling to electrical contact and thermal management, has been optimized to ensure safe handling, stable electrical contact, even at elevated temperatures, and consistent, repeatable test results over time.
In addition to TPAK, the platform supports a wide range of power discrete packages, including T‑MAX, TO264 and TO247 (in both 3‑lead and 4‑lead versions), TO220, TO263 and D3PAK, as well as similar form factors. Dedicated conversion kits enable swift adaptation to different package types and input/output media requirements.
High Throughput with Multi‑Station Architecture
At the heart of the NeoDTH lies a 16‑position, high‑speed turret, which is combined with a true multi‑station architecture. The system can manage up to six independent test stations, enabling parallel testing and significantly increasing throughput without compromising test accuracy.
Designed for continuous production, the DTH ensures stable, reliable operation and minimizes downtime, keeping production running smoothly. The result is increased uptime and optimized overall equipment efficiency.
Multi‑Station Discrete Test Handler for TPAK Power MOSFETs
The NeoDTH is a high‑performance multi‑station discrete test handler engineered to meet the most demanding requirements of power semiconductor testing. Specifically designed for TPAK Power MOSFETs, it delivers advanced thermal testing capabilities, high throughput up to 2,700 units per hour, and seamless integration into modern automated factories. A robust and flexible platform built for automotive, industrial, and power electronics applications where quality, reliability, and productivity are critical.
True power device validation occurs under real operating conditions.
The NeoDTH is designed to perform accurate, stable, and repeatable thermal tests, ensuring the reliable characterization of Power MOSFETs throughout the production process. The system supports programmable thermal soak up at temperatures of up to 175°C, with an accuracy of ±3°C, and features active temperature control at each test station. An optional nitrogen atmosphere provides additional protection for the device during high-temperature testing. This makes the NeoDTH ideal for high‑temperature electrical testing, stress validation, and corner‑lot verification.
The result is superior correlation with real‑world operating conditions and consistent, reliable product quality.
This test solution has been developed with one clear focus: to maximize performance when testing TPAK Power MOSFETs. Every detail, from device handling to electrical contact and thermal management, has been optimized to ensure safe handling, stable electrical contact, even at elevated temperatures, and consistent, repeatable test results over time.
In addition to TPAK, the platform supports a wide range of power discrete packages, including T‑MAX, TO264 and TO247 (in both 3‑lead and 4‑lead versions), TO220, TO263 and D3PAK, as well as similar form factors. Dedicated conversion kits enable swift adaptation to different package types and input/output media requirements.
High Throughput with Multi‑Station Architecture
At the heart of the NeoDTH lies a 16‑position, high‑speed turret, which is combined with a true multi‑station architecture. The system can manage up to six independent test stations, enabling parallel testing and significantly increasing throughput without compromising test accuracy.
Designed for continuous production, the DTH ensures stable, reliable operation and minimizes downtime, keeping production running smoothly. The result is increased uptime and optimized overall equipment efficiency.
